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Titolo:
MORPHOLOGICAL EFFECTS IN THE QUANTUM YIELD OF CESIUM IODIDE
Autore:
ALMEIDA J; BARBO F; BERTOLO M; BIANCO A; BRAEM A; CERASARI S; COLUZZA C; DELLORTO T; FONTANA S; MARGARITONDO G; NAPPI E; PAIC G; PIUZ F; SANJINES R; SCOGNETTI T; SGOBBA S;
Indirizzi:
PH ECUBLENS,EPFL,IPA,DP CH-1015 LAUSANNE SWITZERLAND PH ECUBLENS,EPFL,IPA,DP CH-1015 LAUSANNE SWITZERLAND SINCROTRONE TRIESTE I-34012 TRIESTE ITALY CERN,DIV PPE CH-1211 GENEVA 23 SWITZERLAND IST NAZL FIS NUCL I-70126 BARI ITALY
Titolo Testata:
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment
fascicolo: 3, volume: 361, anno: 1995,
pagine: 524 - 538
SICI:
0168-9002(1995)361:3<524:MEITQY>2.0.ZU;2-E
Fonte:
ISI
Lingua:
ENG
Soggetto:
SECONDARY-ELECTRON EMISSION; RAY PHOTO-CATHODES; WAVELENGTH BAND 1-300; X-RAYS; CSI; PHOTOCATHODES; INSULATORS; MODELS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
35
Recensione:
Indirizzi per estratti:
Citazione:
J. Almeida et al., "MORPHOLOGICAL EFFECTS IN THE QUANTUM YIELD OF CESIUM IODIDE", Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 361(3), 1995, pp. 524-538

Abstract

We demonstrated that polycrystalline cesium iodide (CsI) on large area Ni/Au coated printed board provides a quantum efficiency (QE) higherby a factor of 2 than the films deposited on the standard Cu/Au printed circuits. This is the most important result of the present systematic study of the QE lateral inhomogeneity for CsI on different substrates. We found a strong correlation between the QE lateral variation andthe morphological homogeneity of the films. The QE was measured by UVphotoelectron emission microscopy and spatially resolved X-ray photoemission, and the morphology studies were performed by secondary electron microscopy, X-ray diffraction and scanning tunneling microscopy.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 02/12/20 alle ore 04:44:18