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Titolo:
THE X-RAY-POLARIZATION SENSITIVITY OF CCDS
Autore:
HOLLAND AD; SHORT ADT; FRASER GW; TURNER MJL;
Indirizzi:
UNIV LEICESTER,DEPT PHYS & ASTRON,XRAY ASTRON GRP LEICESTER LE1 7RH LEICS ENGLAND UNIV LEICESTER,DEPT PHYS & ASTRON,XRAY ASTRON GRP LEICESTER LE1 7RH LEICS ENGLAND
Titolo Testata:
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment
fascicolo: 2-3, volume: 355, anno: 1995,
pagine: 526 - 531
SICI:
0168-9002(1995)355:2-3<526:TXSOC>2.0.ZU;2-A
Fonte:
ISI
Lingua:
ENG
Soggetto:
ELECTRON PENETRATION; POLARIZATION; POLARIMETER; ASTRONOMY; SOLIDS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
24
Recensione:
Indirizzi per estratti:
Citazione:
A.D. Holland et al., "THE X-RAY-POLARIZATION SENSITIVITY OF CCDS", Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 355(2-3), 1995, pp. 526-531

Abstract

The regular array of pixels in a silicon Charge Coupled Device (CCD) may be used to measure photoelectron emission directions following theabsorption of high energy X-rays (E > 15 keV). CCDs offer, therefore,the possibility of combining X-ray imaging and spectroscopy with measurement of the linear polarisation of the incident beam. We describe asimple model of electron transport in CCDs which leads to an estimateof the energy-dependent modulation factor M(E) - the parameter determining polarisation sensitivity - for arbitrary pixel geometries. The predictions of the model are in good agreement with published astronomyis assessed.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 18/09/20 alle ore 11:13:44