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Titolo:
DETERMINATION OF LOCAL CRYSTAL QUALITY CH ARACTERISTICS AND OF THE ORIENTATION OF CDTE SEMICONDUCTOR-FILMS BY NONLINEAR-OPTICAL METHODS
Autore:
BALANYUK VV; KRASNOV VF; MUSHER SL; PROTS VI; RYABCHENKO VE; STOYANOV SA; STRUTS SG; STUPAK MF; SYSKIN VS;
Indirizzi:
RUSSIAN ACAD SCI,SIBERIAN DIV,INST AUTOMAT & ELECTROMETRY NOVOSIBIRSKRUSSIA NOVOSIBIRSK STATE UNIV NOVOSIBIRSK 630090 RUSSIA
Titolo Testata:
Kvantovaa elektronika
fascicolo: 2, volume: 22, anno: 1995,
pagine: 196 - 200
SICI:
0368-7147(1995)22:2<196:DOLCQC>2.0.ZU;2-I
Fonte:
ISI
Lingua:
RUS
Soggetto:
DIAGNOSTICS;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
4
Recensione:
Indirizzi per estratti:
Citazione:
V.V. Balanyuk et al., "DETERMINATION OF LOCAL CRYSTAL QUALITY CH ARACTERISTICS AND OF THE ORIENTATION OF CDTE SEMICONDUCTOR-FILMS BY NONLINEAR-OPTICAL METHODS", Kvantovaa elektronika, 22(2), 1995, pp. 196-200

Abstract

The local crystal quality of epitaxial CdTe films was investigated inthe transmission geometry by generation of the second harmonic of a YAP:Nd laser. A computer controlled laser unit was constructed specifically for fast local diagnostics of the crystal quality of epitaxial films.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 21/09/20 alle ore 12:57:19