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Titolo:
DETERMINATION OF THE MEAN SIZE OF SUBMICRON PARTICLES BY ELECTRON-PROBE MICROANALYSIS
Autore:
BERNER A; LEVIN I; KLINGER L; BRANDON DG;
Indirizzi:
TECHNION ISRAEL INST TECHNOL,DEPT MAT ENGN IL-32000 HAIFA ISRAEL
Titolo Testata:
X-ray spectrometry
fascicolo: 1, volume: 24, anno: 1995,
pagine: 13 - 18
SICI:
0049-8246(1995)24:1<13:DOTMSO>2.0.ZU;2-T
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
23
Recensione:
Indirizzi per estratti:
Citazione:
A. Berner et al., "DETERMINATION OF THE MEAN SIZE OF SUBMICRON PARTICLES BY ELECTRON-PROBE MICROANALYSIS", X-ray spectrometry, 24(1), 1995, pp. 13-18

Abstract

A method for the determination of the mean size of submicron particles randomly distributed in a matrix by electron probe x-ray microanalysis (EPMA) is described. The method is based on an analysis of varianceof the characteristic x-ray intensity from an element contained only in the particle. Analytical expressions relating this variance to the mean size of the particles were derived and the method was validated using test samples. The present technique can be used with a conventional x-ray microanalyser for the rapid determination of the mean size ofsubmicron particles.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 09/07/20 alle ore 16:37:11