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Titolo:
CHARACTERIZATION AND QUALITY-CONTROL OF SILICON MICROSTRIP DETECTORS WITH AN INFRARED DIODE-LASER SYSTEM
Autore:
SHAHEEN S; BOISSEVAIN J; COLLIER W; JACAK BV; LOCK JS; ROYBAL P; SIMONGILLO J; SONDHEIM W; SULLIVAN JP; ZIOCK H;
Indirizzi:
LOS ALAMOS NATL LAB,DIV PHYS,MS D456 LOS ALAMOS NM 87545 LOS ALAMOS NATL LAB,DIV PHYS LOS ALAMOS NM 87545
Titolo Testata:
Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment
fascicolo: 3, volume: 352, anno: 1995,
pagine: 573 - 578
SICI:
0168-9002(1995)352:3<573:CAQOSM>2.0.ZU;2-S
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
18
Recensione:
Indirizzi per estratti:
Citazione:
S. Shaheen et al., "CHARACTERIZATION AND QUALITY-CONTROL OF SILICON MICROSTRIP DETECTORS WITH AN INFRARED DIODE-LASER SYSTEM", Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 352(3), 1995, pp. 573-578

Abstract

A system using a 1064 nm infrared diode laser has been developed to characterize silicon microstrip detectors. The spot size from the diodehas been optically collimated to 25 mu m so that strips can be irradiated individually. Results from diagnostic tests such as strip-to-strip variations, attenuation length along a strip, angle of incidence andcharge sharing studies are presented. An affordable, computer-controlled system has been built to test many silicon sensors prior to final assembly of the detector.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 02/12/20 alle ore 05:28:29