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Titolo:
GEMS STUDY OF FE-SI CR MULTILAYERED FILMS
Autore:
ZHANG YM; YAN SS; MA XD; LIU YH;
Indirizzi:
SHANDONG UNIV,DEPT PHYS JINAN 250100 PEOPLES R CHINA
Titolo Testata:
Journal of magnetism and magnetic materials
fascicolo: 1-2, volume: 139, anno: 1995,
pagine: 139 - 142
SICI:
0304-8853(1995)139:1-2<139:GSOFCM>2.0.ZU;2-I
Fonte:
ISI
Lingua:
ENG
Soggetto:
GIANT MAGNETORESISTANCE; EXCHANGE;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
6
Recensione:
Indirizzi per estratti:
Citazione:
Y.M. Zhang et al., "GEMS STUDY OF FE-SI CR MULTILAYERED FILMS", Journal of magnetism and magnetic materials, 139(1-2), 1995, pp. 139-142

Abstract

An oscillatory variation of saturation magnetization (M(s)) with the thickness of Cr layers has been found in Fe-Si/Cr multilayered films prepared by rf sputtering under 5 mTorr Ar charging pressure. A conversion electron Mossbauer spectroscopy (GEMS) study showed that the oscillatory variation of M(s) does not result from antiferromagnetic coupling effect, but mainly from an oscillatory change in the paramagnetic component of the Fe-Si layers. This oscillatory change in the paramagnetic component in the Fe-Si layers is due the unusual interlayer coupling effect through the Cr layers.

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Documento generato il 24/01/20 alle ore 12:21:02