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Titolo:
CHARACTERIZATION STUDY OF CDS PASSIVATION LAYERS ON HGXCD1-XTE
Autore:
KACIULIS S; MATTOGNO G; MARINI ME; CESQUI F; ALFUSO S; MERCURI A;
Indirizzi:
CNR,IST CHIM MAT,CP 10 I-00016 MONTEROTONDO ITALY CNR,IST CHIM MAT I-00016 MONTEROTONDO ITALY ALENIA I-00131 ROME ITALY SEMICOND PHYS INST 2600 VILNIUS LITHUANIA
Titolo Testata:
Materials science & engineering. B, Solid-state materials for advanced technology
fascicolo: 1-3, volume: 28, anno: 1994,
pagine: 43 - 46
SICI:
0921-5107(1994)28:1-3<43:CSOCPL>2.0.ZU;2-C
Fonte:
ISI
Lingua:
ENG
Soggetto:
ANODIC SULFIDE FILMS; MERCURY CADMIUM TELLURIDE; NATIVE SULFIDES; HG1-XCDXTE; INTERFACE; CHEMISTRY; SURFACES;
Keywords:
X-RAY SPECTROSCOPY; CADMIUM SULFIDE; AUGER ELECTRON SPECTROSCOPY; MERCURY TELLURIDE;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
14
Recensione:
Indirizzi per estratti:
Citazione:
S. Kaciulis et al., "CHARACTERIZATION STUDY OF CDS PASSIVATION LAYERS ON HGXCD1-XTE", Materials science & engineering. B, Solid-state materials for advanced technology, 28(1-3), 1994, pp. 43-46

Abstract

HgxCd1-xTe epitaxial samples were passivated using an anodic non-aqueous sulphidation technique. The chemical composition and thickness of the CdS thin films deposited were investigated by selected-area X-ray photoelectron spectroscopy combined with Ar+ ion sputtering. The CdS films formed on HgxCd1-xTe were found to be nearly stoichiometric; their thickness varied with the sulphidation temperature and time. The lateral non-homogeneity of the CdS passivation layers was studied by means of scanning Auger microscopy. The chemical composition and origin ofthe ''holes'' observed in the CdS films deposited were revealed by the Auger chemical images obtained.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 29/11/20 alle ore 08:43:21