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Titolo:
ACTIVE HETERODYNE INTERFEROMETRIC DISPLACEMENT MEASUREMENT USING OPTICAL FEEDBACK EFFECTS OF LASER-DIODES
Autore:
TAKAHASHI N; KAKUMA S; OHBA R;
Indirizzi:
HOKKAIDO UNIV,FAC ENGN,DEPT APPL PHYS,KITA KU,KITA-13 NISHI-8 SAPPOROHOKKAIDO 060 JAPAN
Titolo Testata:
Optical engineering
fascicolo: 3, volume: 35, anno: 1996,
pagine: 802 - 807
SICI:
0091-3286(1996)35:3<802:AHIDMU>2.0.ZU;2-X
Fonte:
ISI
Lingua:
ENG
Soggetto:
CAVITY SEMICONDUCTOR-LASER; EXTERNAL-CAVITY; INJECTION-LASER; TUNING RANGE; SPECTRUM;
Keywords:
DISPLACEMENT MEASUREMENT; EXTERNAL CAVITY LASER DIODE; ACTIVE HETERODYNE INTERFEROMETRY;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
19
Recensione:
Indirizzi per estratti:
Citazione:
N. Takahashi et al., "ACTIVE HETERODYNE INTERFEROMETRIC DISPLACEMENT MEASUREMENT USING OPTICAL FEEDBACK EFFECTS OF LASER-DIODES", Optical engineering, 35(3), 1996, pp. 802-807

Abstract

A novel method is presented for precision displacement measurement based on active heterodyne interferometry. A pair of laser diodes, each of which is equipped with an external cavity, are used as light sources. A small displacement of a piezoelectric transducer, which carries the reflecting mirror of the external cavity, causes lasing frequency shift due to optical feedback on the laser diode. Detection of the optical frequency shift is accomplished by a heterodyne arrangement. Direct counting of the heterodyne beat frequency enables precise measurement of a dynamic displacement without any complex numerical calculation. Excellent performance of the presented method is illustrated by experimental results on the measurement for small displacement with an accuracy of +/-5 nm and a time resolution of 33 ms. (C) 1996 Society of Photo-Optical instrumentation Engineers.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 27/09/20 alle ore 21:39:19