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Titolo:
A NEAR-FIELD OPTICAL MICROSCOPE WITH NORMAL FORCE DISTANCE REGULATION
Autore:
STEPHENSON RJ; OSHEA SJ; BARNES JR; RAYMENT T; WELLAND ME;
Indirizzi:
UNIV CAMBRIDGE,DEPT ENGN CAMBRIDGE CB2 1PZ ENGLAND UNIV CAMBRIDGE,DEPT CHEM CAMBRIDGE CB2 1PZ ENGLAND
Titolo Testata:
Review of scientific instruments
fascicolo: 11, volume: 67, anno: 1996,
pagine: 3891 - 3897
SICI:
0034-6748(1996)67:11<3891:ANOMWN>2.0.ZU;2-B
Fonte:
ISI
Lingua:
ENG
Soggetto:
LOCALIZED CHARGE; SHEAR FORCE;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
25
Recensione:
Indirizzi per estratti:
Citazione:
R.J. Stephenson et al., "A NEAR-FIELD OPTICAL MICROSCOPE WITH NORMAL FORCE DISTANCE REGULATION", Review of scientific instruments, 67(11), 1996, pp. 3891-3897

Abstract

Near-field imaging is a means of exceeding the diffraction limit in optical microscopy to yield subwavelength resolution optical images of a sample surface. In order to achieve such high resolution, it is necessary to scan the measurement probe above the surface at a height of only a few nanometers which requires careful control of the separation between tip and sample. In the implementation of the near-field optical microscope (NFOM) reported here, the distance regulation scheme is based on an inverted noncontact atomic force microscope (AFM) in which a cantilever is used as the sample substrate and imaging is performed with a fiber optic tip. In this way, both the benefits of AFM and NFOMare realized simultaneously. (C) 1996 American Institute of Physics.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 05/12/20 alle ore 01:59:51