Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
MICRODAC - A NOVEL-APPROACH TO MEASURE IN-SITU DEFORMATION FIELDS OF MICROSCOPIC SCALE
Autore:
VOGEL D; SCHUBERT A; FAUST W; DUDEK R; MICHEL B;
Indirizzi:
FRAUNHOFER INST RELIABIL & MICROINTEGRAT,GUSTAV MEYER ALLEE 25 D-13353 BERLIN GERMANY
Titolo Testata:
Microelectronics and reliability
fascicolo: 11-12, volume: 36, anno: 1996,
pagine: 1939 - 1942
SICI:
0026-2714(1996)36:11-12<1939:M-ANTM>2.0.ZU;2-E
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
3
Recensione:
Indirizzi per estratti:
Citazione:
D. Vogel et al., "MICRODAC - A NOVEL-APPROACH TO MEASURE IN-SITU DEFORMATION FIELDS OF MICROSCOPIC SCALE", Microelectronics and reliability, 36(11-12), 1996, pp. 1939-1942

Abstract

Measurements of displacement fields on packaging components under mechanical and thermal load allow to analyse actual material behaviour. Strain distributions in components and assemblies, i.e. consequently locations of crucial strain and stress are determined. The microDAC method bases on algorithms of local object structure tracking in images obtained from optical, laser scanning and electron scanning microscopy. Measured deformation fields can be utilised for design optimisation, proper material selection and processing, as well as for verification of finite element simulations. Copyright (C) 1996 Elsevier Science Ltd

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 13/07/20 alle ore 07:58:43