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Titolo:
ENHANCED RAMAN-SCATTERING FROM SELF-AFFINE THIN-FILMS
Autore:
POLIAKOV EY; SHALAEV VM; MARKEL VA; BOTET R;
Indirizzi:
NEW MEXICO STATE UNIV,DEPT PHYS LAS CRUCES NM 88003 NEW MEXICO STATE UNIV,DEPT PHYS LAS CRUCES NM 88003 UNIV PARIS 11,CTR ORSAY,PHYS SOLIDES LAB F-91405 ORSAY FRANCE
Titolo Testata:
Optics letters
fascicolo: 20, volume: 21, anno: 1996,
pagine: 1628 - 1630
SICI:
0146-9592(1996)21:20<1628:ERFST>2.0.ZU;2-8
Fonte:
ISI
Lingua:
ENG
Soggetto:
MICROSCOPY;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
14
Recensione:
Indirizzi per estratti:
Citazione:
E.Y. Poliakov et al., "ENHANCED RAMAN-SCATTERING FROM SELF-AFFINE THIN-FILMS", Optics letters, 21(20), 1996, pp. 1628-1630

Abstract

Surface-enhanced Raman scattering (SERS) from a self-affine surface is shown to be very large. A theory is developed expressing this SERS in terms of the eigenmodes of a self-affine surface; the theory successfully explains the observed SERS from cold-deposited thin films that are known to have a self-affine structure. Spatial distributions of local fields at the fundamental and Stokes frequencies are strongly inhomogeneous and contain hot zones (high-field areas) localized in nanometer-sized regions that can be spatially separated for the two waves. (C) 1996 Optical Society of America

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Documento generato il 22/09/20 alle ore 16:22:58