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Titolo:
MEASUREMENT OF THE INCLUSIVE SEMIELECTRONIC D-0 BRANCHING FRACTION
Autore:
KUBOTA Y; LATTERY M; NELSON JK; PATTON S; POLING R; RIEHLE T; SAVINOV V; WANG R; ALAM MS; KIM IJ; LING Z; MAHMOOD AH; ONEILL JJ; SEVERINI H; SUN CR; TIMM S; WAPPLER F; CRAWFORD G; DUBOSCQ JE; FULTON R; FUJINO D; GAN KK; HONSCHEID K; KAGAN H; KASS R; LEE J; SUNG M; WHITE C; WANKE R; WOLF A; ZOELLER MM; FU X; NEMATI B; ROSS WR; SKUBIC P; WOOD M; BISHAI M; FAST J; GERNDT E; HINSON JW; MIAO T; MILLER DH; MODESITT M; SHIBATA EI; SHIPSEY IPJ; WANG PN; GIBBONS L; JOHNSON SD; KWON Y; ROBERTS S; THORNDIKE EH; COAN TE; DOMINICK J; FADEYEV V; KOROLKOV I; LAMBRECHT M; SANGHERA S; SHELKOV V; STROYNOWSKI R; VOLOBOUEV I; WEI G; ARTUSO M; GAO M; GOLDBERG M; HE D; HORWITZ N; KOPP S; MONETI GC; MOUNTAIN R; MUHEIM F; MUKHIN Y; PLAYFER S; SKWARNICKI T; STONE S; XING X; BARTELT J; CSORNA SE; JAIN V; MARKA S; GIBAUT D; KINOSHITA K; POMIANOWSKI P; SCHRENK S; BARISH B; CHADHA M; CHAN S; COWEN DF; EIGEN G; MILLER JS; OGRADY C; URHEIM J; WEINSTEIN AJ; WURTHWEIN F; ASNER DM; ATHANAS M; BLISS DW; BROWER WS; MASEK G; PAAR HP; GRONBERG J; KORTE CM; KUTSCHKE R; MENARY S; MORRISON RJ; NAKANISHI S; NELSON HN; NELSON TK; QIAO C; RICHMAN JD; ROBERTS D; RYD A; TAJIMA H; WITHERELL MS; BALEST R; CHO K; FORD WT; LOHNER M; PARK H; RANKIN P; ROY J; SMITH JG; ALEXANDER JP; BEBEK C; BERGER BE; BERKELMAN K; BLOOM K; BROWDER TE; CASSEL DG; CHO HA; COFFMAN DM; CROWCROFT DS; DICKSON M; DRELL PS; DUMAS DJ; EHRLICH R; ELIA R; GAIDAREV P; GITTELMAN B; GRAY SW; HARTILL DL; HELTSLEY BK; HENDERSON S; JONES CD; JONES SL; KANDASWAMY J; KATAYAMA N; KIM PC; KREINICK DL; LEE T; LIU Y; LUDWIG GS; MASUI J; MEVISSEN J; MISTRY NB; NG CR; NORDBERG E; PATTERSON JR; PETERSON D; RILEY D; SOFFER A; WARD C; AVERY P; FREYBERGER A; LINGEL K; PRESCOTT C; RODRIGUEZ J; YANG S; YELTON J; BRANDENBURG G; CINABRO D; LIU T; SAULNIER M; WILSON R; YAMAMOTO H; BERGFELD T; EISENSTEIN BI; ERNST J; GLADDING GE; GOLLIN GD; PALMER M; SELEN M; THALER JJ; EDWARDS KW; MCLEAN KW; OGG M; BELLERIVE A; BRITTON DI; HYATT ERF; JANICEK R; MACFARLANE DB; PATEL PM; SPAAN B; SADOFF AJ; AMMAR R; BARINGER P; BEAN A; BESSON D; COPPAGE D; COPTY N; DAVIS R; HANCOCK N; KOTOV S; KRAVCHENKO I; KWAK N;
Indirizzi:
UNIV MINNESOTA MINNEAPOLIS MN 55455 SUNY ALBANY ALBANY NY 12222 OHIO STATE UNIV COLUMBUS OH 43210 UNIV OKLAHOMA NORMAN OK 73019 PURDUE UNIV W LAFAYETTE IN 47907 UNIV ROCHESTER ROCHESTER NY 14627 SO METHODIST UNIV DALLAS TX 75275 SYRACUSE UNIV SYRACUSE NY 13244 VANDERBILT UNIV NASHVILLE TN 37235 VIRGINIA POLYTECH INST & STATE UNIV BLACKSBURG VA 24061 CALTECH PASADENA CA 91125 UNIV CALIF SAN DIEGO LA JOLLA CA 92093 UNIV CALIF SANTA BARBARA SANTA BARBARA CA 93106 UNIV COLORADO BOULDER CO 80309 CORNELL UNIV ITHACA NY 14853 UNIV FLORIDA GAINESVILLE FL 32611 HARVARD UNIV CAMBRIDGE MA 02138 UNIV ILLINOIS URBANA IL 61801 CARLETON UNIV OTTAWA ON K1S 5B6 CANADA INST PARTICLE PHYS OTTAWA ON K1S 5B6 CANADA MCGILL UNIV MONTREAL PQ H3A 2T8 CANADA INST PARTICLE PHYS MONTREAL PQ H3A 2T8 CANADA ITHACA COLL ITHACA NY 14850 UNIV KANSAS LAWRENCE KS 66045
Titolo Testata:
Physical review. D. Particles and fields
fascicolo: 5, volume: 54, anno: 1996,
pagine: 2994 - 3005
SICI:
0556-2821(1996)54:5<2994:MOTISD>2.0.ZU;2-9
Fonte:
ISI
Lingua:
ENG
Soggetto:
D-MESON; DECAY; RATIO;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
34
Recensione:
Indirizzi per estratti:
Citazione:
Y. Kubota et al., "MEASUREMENT OF THE INCLUSIVE SEMIELECTRONIC D-0 BRANCHING FRACTION", Physical review. D. Particles and fields, 54(5), 1996, pp. 2994-3005

Abstract

Using the angular correlation between the pi(+) emitted in a D(+)-->D-0 pi(+) decay and the e(+) emitted in the subsequent D-0-->Xe+ nu decay, we have measured the branching fraction for the inclusive semielectronic decay of the D-0 meson to be B(D-0-->Xe+ nu)=[6.64+/-0.18(stat)+/-0.29(syst)]%. The measurement uses 1.7 fb(-1) of e(+)e(-) collisions recorded by the CLEO II detector located at the Cornell Electron Storage Ring (CESR). Combining this result with previous CLEO results wefind B(D-0-->Xe+ nu)/B(D-0-->K- pi(+)) = 1.684+/-0.056(stat)+/-0.093(syst) and B(D-0-->K(-)e(+) nu)/B(D-0-->Xe+ nu)=0.581+/-0.023(stat)+/-0.028(syst). The difference between this inclusive rate and the sum of the measured exclusive branching fractions (measured at CLEO and otherexperiments) is also presented.

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Documento generato il 05/12/20 alle ore 19:54:32