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Titolo:
ATOMIC-FORCE MICROSCOPY STRESS SENSORS FOR STUDIES IN LIQUIDS
Autore:
OSHEA SJ; WELLAND ME; BRUNT TA; RAMADAN AR; RAYMENT T;
Indirizzi:
UNIV CAMBRIDGE,DEPT ENGN CAMBRIDGE CB2 1PZ ENGLAND UNIV CAMBRIDGE,DEPT CHEM CAMBRIDGE CB2 1EW ENGLAND
Titolo Testata:
Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena
fascicolo: 2, volume: 14, anno: 1996,
pagine: 1383 - 1385
SICI:
1071-1023(1996)14:2<1383:AMSSFS>2.0.ZU;2-C
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
10
Recensione:
Indirizzi per estratti:
Citazione:
S.J. Oshea et al., "ATOMIC-FORCE MICROSCOPY STRESS SENSORS FOR STUDIES IN LIQUIDS", Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1383-1385

Abstract

Simple, sensitive, and fast sensors can be constructed from standard atomic force microscopy cantilevers. For use in liquid environments, it is preferable to use changes in surface stress as the measurement basis of the sensor. We have constructed such a sensor in an electrochemical cell so that simultaneous cyclic voltammograms and strain measurements can be made. This is demonstrated with examples of underpotential deposition of Pb on Au(lll) and electrocapillary effects in KCl. (C)1996 American Vacuum Society.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 01/12/20 alle ore 15:45:46