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Titolo:
A BINARY MARKOV PROCESS MODEL FOR RANDOM TESTING
Autore:
CHEN SP; MILLS S;
Indirizzi:
CARLETON UNIV,CTR STAT CONSULTING OTTAWA ON K1S 5B6 CANADA CARLETON UNIV,DEPT MATH & STAT OTTAWA ON K1S 5B6 CANADA
Titolo Testata:
IEEE transactions on software engineering
fascicolo: 3, volume: 22, anno: 1996,
pagine: 218 - 223
SICI:
0098-5589(1996)22:3<218:ABMPMF>2.0.ZU;2-Q
Fonte:
ISI
Lingua:
ENG
Soggetto:
SOFTWARE; SAFETY;
Keywords:
BINARY MARKOV PROCESS; DEPENDENT TEST RUNS; RANDOM TESTING; SOFTWARE RELIABILITY; STATISTICAL TESTING; ULTRA-RELIABILITY APPLICATION;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
CompuMath Citation Index
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
14
Recensione:
Indirizzi per estratti:
Citazione:
S.P. Chen e S. Mills, "A BINARY MARKOV PROCESS MODEL FOR RANDOM TESTING", IEEE transactions on software engineering, 22(3), 1996, pp. 218-223

Abstract

In this work a binary Markov process model is proposed for random testing for software. This model is suggested to replace the standard binomial distribution model, which is based on the easily-violated assumption of test runs being statistically independent of each other. In addition to a general result on the probability of having any specific number of software failures during testing, practical implications of the new model are also discussed. In particular, we demonstrate that ingeneral the effect of possible correlation between test runs cannot be ignored in estimating software reliability.

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Documento generato il 18/09/20 alle ore 10:58:01