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Titolo:
EVALUATION OF ELECTRICALLY POLAR SUBSTANCES BY ELECTRIC SCANNING FORCE MICROSCOPY .1. MEASUREMENT SIGNALS DUE TO MAXWELL STRESS
Autore:
FRANKE K; WEIHNACHT M;
Indirizzi:
IFW DRESDEN EV D-01171 DRESDEN GERMANY
Titolo Testata:
Ferroelectrics. Letters section
fascicolo: 1-2, volume: 19, anno: 1995,
pagine: 25 - 33
SICI:
0731-5171(1995)19:1-2<25:EOEPSB>2.0.ZU;2-Y
Fonte:
ISI
Lingua:
ENG
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
11
Recensione:
Indirizzi per estratti:
Citazione:
K. Franke e M. Weihnacht, "EVALUATION OF ELECTRICALLY POLAR SUBSTANCES BY ELECTRIC SCANNING FORCE MICROSCOPY .1. MEASUREMENT SIGNALS DUE TO MAXWELL STRESS", Ferroelectrics. Letters section, 19(1-2), 1995, pp. 25-33

Abstract

The electric scanning force microscope (EFM) is used for the high-resolution characterization of electrically polar substances. An EFM is considered, the tip of which is electrically conductive and has a givenpotential. The tip of the EFM is exposed to Maxwell stress caused by ferroelectric domains and sample permittivity. This Maxwell stress is analytically calculated in a one-dimensional model. The results of calculation are compared with the results of EFM measurements. The methodfor measuring ferroelectric domains is in particular discussed.

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Documento generato il 01/12/20 alle ore 10:47:27