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Titolo:
ELECTRON SOURCE BRIGHTNESS AND DEGENERACY FROM FRESNEL FRINGES IN-FIELD EMISSION POINT PROJECTION MICROSCOPY
Autore:
SPENCE JCH; QIAN W; SILVERMAN MP;
Indirizzi:
ARIZONA STATE UNIV,DEPT PHYS & ASTRON TEMPE AZ 85287 TRINITY COLL,DEPT PHYS & ASTRON HARTFORD CT 06106
Titolo Testata:
Journal of vacuum science & technology. A. Vacuum, surfaces, and films
fascicolo: 2, volume: 12, anno: 1994,
pagine: 542 - 547
SICI:
0734-2101(1994)12:2<542:ESBADF>2.0.ZU;2-8
Fonte:
ISI
Lingua:
ENG
Soggetto:
RESOLUTION;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
22
Recensione:
Indirizzi per estratti:
Citazione:
J.C.H. Spence et al., "ELECTRON SOURCE BRIGHTNESS AND DEGENERACY FROM FRESNEL FRINGES IN-FIELD EMISSION POINT PROJECTION MICROSCOPY", Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(2), 1994, pp. 542-547

Abstract

Fresnel edge fringes observed in a lensless point projection field-emission electron microscope operating at 90 eV have been studied and found to be formally equivalent to the fringes observed in transmission electron microscopy (TEM) under weak scattering conditions at the edgeof an opaque object. The tip-to-spectrum distance z1 plays the role of the objective lens defocus setting DELTAf in conventional TEM. The image magnification, effective source size, transverse coherence width,instrumental resolution, and source brightness are all obtained from an analysis of the fringe spacings and intensity. The quantum mechanical upper limit on source brightness, as well as relationships among beam brightness, coherence parameters, and degeneracy, are discussed, and the degeneracy measured from experimental Fresnel fringes.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 21/09/20 alle ore 06:21:57