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Titolo:
SOL-GEL SYNTHESIS AND CHARACTERIZATION OF MAGNESIUM-SILICATE THIN-FILMS
Autore:
JONES SA; WONG S; BURLITCH JM; VISWANATHAN S; KOHLSTEDT DL;
Indirizzi:
CORNELL UNIV,BAKER LAB,DEPT CHEM ITHACA NY 14853 CORNELL UNIV,BAKER LAB,DEPT CHEM ITHACA NY 14853 UNIV MINNESOTA,DEPT GEOL & GEOPHYS MINNEAPOLIS MN 55455
Titolo Testata:
Chemistry of materials
fascicolo: 11, volume: 9, anno: 1997,
pagine: 2567 - 2576
SICI:
0897-4756(1997)9:11<2567:SSACOM>2.0.ZU;2-2
Fonte:
ISI
Lingua:
ENG
Soggetto:
ANTIREFLECTION COATINGS; PHOTORESIST FILMS; FORSTERITE; HARDNESS; CELLS; OLIVINE; LOAD;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
55
Recensione:
Indirizzi per estratti:
Citazione:
S.A. Jones et al., "SOL-GEL SYNTHESIS AND CHARACTERIZATION OF MAGNESIUM-SILICATE THIN-FILMS", Chemistry of materials, 9(11), 1997, pp. 2567-2576

Abstract

An H2O2-assisted, sol-gel synthesis route to precursors to magnesium silicate thin films is described. Films having ratios of Mg to Si from1 to 3 were prepared by spin-coating. On substrates such as silicon, aluminum, steel, glass, and fused silica, repeated coatings were applied, without intermittent treatment, to give similar to 0.5 mu m thick films. Crack-free consolidation was achieved by conventional or microwave heating. Densification of the films on silicon was studied by IR spectroscopy, ellipsometry, and microhardness measurements; IR analysisindicated that these films were amorphous to at least 750 degrees C. At high enough temperatures, durable films were obtained that exhibited antireflective properties.

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Documento generato il 09/04/20 alle ore 13:06:32