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Titolo:
OBSERVATION OF SHORT-WAVELENGTH RECORDED PITS IN GESB2TE4 PHASE-CHANGE THIN-FILM BY ATOMIC-FORCE MICROSCOPY
Autore:
MEN LQ; GAN FX; SUN JL; LI MQ;
Indirizzi:
KYOTO UNIV,FAC ENGN,DEPT ELECT SCI & ENGN,VENTURE BUSINESS LAB,SAKYO KU KYOTO 60601 JAPAN ACAD SINICA,SHANGHAI INST OPT & FINE MECH SHANGHAI 201800 PEOPLES R CHINA ACAD SINICA,SHANGHAI INST NUCL RES SHANGHAI 201800 PEOPLES R CHINA
Titolo Testata:
Applied surface science
fascicolo: 1-2, volume: 120, anno: 1997,
pagine: 171 - 179
SICI:
0169-4332(1997)120:1-2<171:OOSRPI>2.0.ZU;2-R
Fonte:
ISI
Lingua:
ENG
Soggetto:
DENSITY; DISK;
Keywords:
PHASE CHANGE MATERIALS; SHORT-WAVELENGTH RECORDING; OPTICAL STORAGE; AFM (ATOMIC FORCE MICROSCOPY); FFM (FUNCTIONAL FORCE MICROSCOPY);
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Science Citation Index Expanded
Science Citation Index Expanded
Citazioni:
15
Recensione:
Indirizzi per estratti:
Citazione:
L.Q. Men et al., "OBSERVATION OF SHORT-WAVELENGTH RECORDED PITS IN GESB2TE4 PHASE-CHANGE THIN-FILM BY ATOMIC-FORCE MICROSCOPY", Applied surface science, 120(1-2), 1997, pp. 171-179

Abstract

Atomic force microscopy (AFM) was used to study the microstructure ofshort-wavelength recorded pits in GeSb2Te4 phase change thin film. Microarea morphology images show that the recorded domain bulges after laser irradiation, With the increase of writing pulse width, a depression appears in the center of the recorded pits, It is demonstrated thatAFM is a very useful tool to evaluate the recorded pits and improve the performance of phase change media. (C) 1997 Elsevier Science B.V.

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 02/07/20 alle ore 22:31:54