Catalogo Articoli (Spogli Riviste)

OPAC HELP

Titolo:
BAND-GAP BOWING AND REFRACTIVE-INDEX SPECTRA OF POLYCRYSTALLINE ALXIN1-XN FILMS DEPOSITED BY SPUTTERING
Autore:
PENG T; PIPREK J; QIU G; OLOWOLAFE JO; UNRUH KM; SWANN CP; SCHUBERT EF;
Indirizzi:
UNIV CALIF SANTA BARBARA,DEPT ELECT & COMP ENGN SANTA BARBARA CA 93106 UNIV DELAWARE,MAT SCI PROGRAM NEWARK DE 19716 UNIV DELAWARE,DEPT ELECT ENGN NEWARK DE 19716 UNIV DELAWARE,DEPT PHYS & ASTRON NEWARK DE 19716 BOSTON UNIV,CTR PHOTON RES BOSTON MA 02215
Titolo Testata:
Applied physics letters
fascicolo: 17, volume: 71, anno: 1997,
pagine: 2439 - 2441
SICI:
0003-6951(1997)71:17<2439:BBARSO>2.0.ZU;2-G
Fonte:
ISI
Lingua:
ENG
Soggetto:
NITRIDE;
Tipo documento:
Article
Natura:
Periodico
Settore Disciplinare:
Science Citation Index Expanded
Citazioni:
6
Recensione:
Indirizzi per estratti:
Citazione:
T. Peng et al., "BAND-GAP BOWING AND REFRACTIVE-INDEX SPECTRA OF POLYCRYSTALLINE ALXIN1-XN FILMS DEPOSITED BY SPUTTERING", Applied physics letters, 71(17), 1997, pp. 2439-2441

Abstract

The AlGaInN semiconductor system is currently of high interest for applications in blue light emitting devices. AlInN is a prospective material for lattice matched confinement layers. We measure the refractiveindex as well as the band gap across the entire compositional range of high-quality polycrystalline AlInN samples. Strong band gap bowing is observed. (C) 1997 American Institute of Physics. [S0003-6951(97)01543-X].

ASDD Area Sistemi Dipartimentali e Documentali, Università di Bologna, Catalogo delle riviste ed altri periodici
Documento generato il 18/09/20 alle ore 11:15:09